ICP_Operations_Guide_2016

The following information may prove useful:

t ćF OFU TJHOBM JOUFOTJUZ XJMM JODSFBTF BT UIF BQQMJFS QPXFS JT JODSFBTFE t ćF CBDLHSPVOE TJHOBM JOUFOTJUZ XJMM JODSFBTF BT UIF BQQMJFE QPXFS JT JODSFBTFE

t *O UIF FBSMZ EBZT PG *$1 UIFSF XBT B MPU PG EJTDVTTJPO BCPVU PQUJNVN QPXFS TFUUJOHT BOE PCTFSWBUJPO IFJHIUT GPS SBEJBM view). Over the years manufacturers have determined the optimum power and observation height settings. Therefore, first try using the settings recommended by the manufacturer. t *G DIBOHFT JO BQQMJFE QPXFS BSF NBEF UIFO EFUFSNJOF UIF FČFDU VQPO UIF EFUFDUJPO MJNJUT PG UIF BOBMZUFT PG JOUFSFTU t )JHIFS OFU TJHOBM JOUFOTJUJFT XJMM OPU OFDFTTBSJMZ SFTVMU JO MPXFS CFUUFS EFUFDUJPO MJNJUT IMPORTANT : Sample Ar Gas Flow cannot be separated from Applied Power and Sampling Depth for ICP-MS. The sample Ar gas flow for ICP-MS systems is a parameter that is more complex than with ICP-OES instrumentation. Assuming the goal is to obtain the maximum signal intensity, the Ar gas flow is closely related to the applied power and sampling depth. There is not a single set of optimum power, sampling depth, and sample Ar flow settings. For example, a higher applied power will increase the signal intensity but change the optimum sampling depth and sample Ar flow. However, the higher sample Ar flow rates required at high power bring about some degradation in other performance characteristics. If the applied power is constant for every method, then the optimum sampling depth will change as the sample Ar is changed. The consideration of MO (metal oxide) formation and different sensitivities at different mass ranges must also be made with increased sample Ar flow. Here are some final observations that may prove useful: t "U B DPOTUBOU BQQMJFE QPXFS BOE TBNQMJOH EFQUI .0 GPSNBUJPO XJMM JODSFBTF XJUI IJHIFS TBNQMF "S ĘPX SBUFT t "U B DPOTUBOU BQQMJFE QPXFS BOE TBNQMJOH EFQUI . GPSNBUJPO XJMM JODSFBTF XJUI IJHIFS TBNQMF "S ĘPX SBUFT t %FQPTJUJPO PO UIF TBNQMFS DPOF XJMM JODSFBTF XJUI IJHIFS TBNQMF "S ĘPX SBUFT t "U B DPOTUBOU BQQMJFE QPXFS BOE TBNQMJOH EFQUI BO JODSFBTFE TBNQMF "S ĘPX XJMM CPPTU UIF TFOTJUJWJUZ PG UIF MJHIUFS NBTTFT relative to the heavy masses. t %FUFSNJOF UIF FČFDU UIBU DIBOHFT JO BQQMJFE QPXFS TBNQMF "S ĘPX TBNQMJOH EFQUI BOE QFSJTUBMUJD QVNQ TQFFE NBLF PO your particular model instrument using a suite of elements covering the mass range. A mixture of Mg, Rh, Ce, and U should suffice where the CeO and Ce +2 masses are measured as well. The above observations may seem confusing, but in reality they give the operator a degree of flexibility that the ICP-OES operator does not have in that you can optimize the instrument for selected mass ranges. For example, we know that a higher BQQMJFE QPXFS XJMM JODSFBTF UIF TJHOBM JOUFOTJUZ 8F BMTP LOPX UIBU UIFSF JT BO PQUJNVN HBT ĘPX GPS FBDI OFCVMJ[FS ćFSFGPSF JG BO BQQMJFE QPXFS PG L8 JT TFMFDUFE BOE XF LOPX UIBU PVS OFCVMJ[FS QFSGPSNT CFTU BU BO "S HBT ĘPX PG - NJO UIFO the nest step is to adjust the sampling depth to give the optimum signal while aspirating a solution containing a combination of light, mid-range, and heavy elements such as Mg, Rh, Ce, and U. If the double ion or MO signals are higher than desirable, a reduction in the peristaltic pump tubing diameter or pumping speed should lower these signals. These initial adjustments will take a lot of time and patience but they are well worth the effort. As the operator makes adjustments in these key parameters, a pattern will begin to unfold allowing the operator to optimize the instrument for selected mass ranges. It is suggested that new ICP-MS operators take the time to determine the trends when changes in applied power, sample Ar flow, sampling depth and peristaltic pump speed are made. t )JHIFS BQQMJFE QPXFS XJMM SFRVJSF IJHIFS TBNQMF "S ĘPX UP BDIJFWF PQUJNVN TFOTJUJWJUZ t *ODSFBTFE TBNQMF "S ĘPX XJMM TIJę UIF JPO [POF JO UIF EJSFDUJPO PG UIF TBNQMFS DPOF PSJĕDF t "T BQQMJFS QPXFS JT JODSFBTFE UIF JPO [POF XJMM TIJę BXBZ GSPN UIF TBNQMFS DPOF PSJĕDF

* Visit inorganicventures.com/tech/icp-operations/ for additional information from this link