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Figure 10. Load-pull (left) and power swept nonlinear data (right) for RF5110G amplifier

References 1. Y Y. Niu, y, Li, D. Jin, L. Su, A Vasilakos, “A survey of millimeter wave communications (mmWave) for 5G: opportunities and challenges,” Wireless Networks, Nov. 2015, Vol. 21, pp2657-2676 . 2. X-parameters is a trademark of Keysight Technologies. www.keysight.com 3. J. Verspecht and D. Root, “Polyharmonic Distortion Modeling,” IEEE Microwave Magazine, vol. 7, no. 3, pp. 44-57, June 2006. 4. J. Horn, D. Root, D. Gunyan, J. Xu, “Method and Apparatus for Determining Response of a DUT to a Desired Large- Signal, and for Determining Input Tones Required to Produce a Desired Output,” US Patent No.: US 7924026 B2, April 12, 2011. 5. D. Root, J. Verspecht, D. Sharrit, J. Wood and A. Cognata, “Broad-Band Poly- Harmonic Distortion (PHD) Behavioral Models from Fast Automated Simulations and Large-Signal Vectoral Network Measurements, IEEE Trans on Microwave Theor. And Tech. Nov. 2005., pp 3656-3664. 6. L. Dunleavy, J.Liu, “Understanding P2D Nonlinear Models,” Microwaves and RF Magazine, July 2007. 7. J. Liu, H. Morales. L. Dunleavy and L.

Betts, “Evaluating X-Parameter, P2D and S2D Models for Characterizing Nonlinear behavior in Active Devices,” High Frequency Design Magazine, November 2011. 8. Maury Microwave Application notes 5C- 083 and 5A-041, https://www.maurymw. com/MW_RF/Application_Notes_Library.php 9. D. Root, J. Verspecht, J. Horn, and H. Marcu, X-Parameters: Characterization, Modeling, and Design of Nonlinear RF and Microwwave Components. Cambridge University Press, 2013. 10. K.Kellogg, J.Liu, and L. Dunleavy, “An EvaluationofStaticSingle-toneX-parameter Models in Time-varying Envelope Domain simulations of Intermodulation Distortion Performance,”IEEE WAMICON 2015, April 2015, Cocoa Beach, FL USA. 11. Modelithics Application Note 059: “Advanced Microwave Amplifier Models and X-Parameter Simulation Setup Examples for Advanced Design System Simulation.” Modelithics, Inc. https:// www.mode l i t h i c s . c om/ L i t e ra t u r e / AppNote.

device information and allows the amplifier to be treated as a black box. When extracted properly, the result is a model that can be used for multi- stage nonlinear analyses and design optimizations of individual amplifier output or inter-stage matching circuits. Information and simulations from example models were used to illustrate the type of documentation provided for each model along with a range of measurement validations showing excellent correlations are possible with nonlinear test data, even if derived from completely independent test benches and verifying test data not used as part of the model development data set. Acknowledgements and Additional Information The authors would like to thank Keysight Technologies for collaboration related to this work as part of the Keysight Solution Partnership program. In particular, we would like to thank Chad Gillease for his great technical support and Jose Civello of Keysight for his helpful editing comments.

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