November_EDFA_Digital

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ANADEF PHOTO CONTEST WINNERS

ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 20 NO. 4

“Metal Brexit: Whiskers in Aluminum,” black and white prize.

“Happy Easter,” unusual and pioneering prize.

“Rising Sun,” aesthetics prize.

“Switch MEMS,” color prize.

“EBSD in Transmission,” technical prize.

“Plasma FIB Etching on Flex Circuit,” public prize.

careers. Tutorials given by industry experts from among ANADEF’s membership covered various subjects from inspection techniques and electrical signature of failed elementary structures to up-to-date VLSI technologies, including their specific failuremechanisms, and emerging SiC/GaN power devices. A high-quality FA photo contest and a new video contest triggered a warm and fair competition among all participants. More than seven videos and 65 photos were submitted for voting, with the six images shown here selected as winners.

The lovely seaside resort of Les Tuquets—along with ANADEF’s comprehensive event planning—made for easy exchanges between attendees at all levels, even after the day program. Participants took advantage of this unique opportunity to share know-how in FA, deepen the dis- cussion of session topics, and chat about business and technical trends. TheANADEF teamextends awarm invitation toall EDFA readers to attend the next workshop, scheduled for 2020. For more information, visit anadef.org.

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