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ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 20 NO. 4

EDFAS MEMBER RECEIVES ASM AWARD T he Electronic Device Failure Analysis Society (EDFAS) is proud to announce that one of itsmembers has been named as a recipient of a 2018 ASM Award. The award was presented on October 16 at ASM’s annual awards dinner during the Materials Science & Technology conference in Columbus, Ohio. ASM FELLOW

Dehua Yang, president and chief scientist at Ebatco in Eden Prairire, Minn., was selected as a Fellow of ASM International. He was cited “for distinct and significant impacts on cutting edge nano- technology applications, including nano-scale materials testing and characterization.” Dr. Yang joins Larry Wagner (2010), Ed Cole (2013), Bill Vanderlinde (2014), and Cheryl Hartfield (2017) as EDFAS members selected for this honor.

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