New-Tech Europe Magazine | Jan 2018

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assuring high mass-production efficiency to help cut terminal costs. The measurement of LTE Category M devices can be automated using a program to control chipsets built into target devices, but, until now, these programs required bespoke development for every customer. Working closely with chipset vendors to establish measurement technologies for LTE Category M devices, Anritsu has been able to develop a turnkey solution to support automated evaluation at world-beating measurement speeds for up to four LTE Category M devices and chipsets without requiring a customer- developed control program. The Universal Wireless Test Set MT8870A is a measurement instrument for mass-production of various types of wireless communications equipment and modules. Four high-performance tester units are installed in the main unit and each unit supports parallel independent measurement for evaluation of up to four wireless devices and modules. The MT8870A already fully supports 2G/3G/LTE/LTE-Advanced/NB- IoT, WLAN/Bluetooth, GPS, and FM evaluations. Installing these software packages in the Universal Wireless Test Set MT8870A provides the world’s first turnkey automated measurement solution for testing and evaluating the RF TRx characteristics of up to four NB-IoT devices and modules at world-beating speed on mass-production lines. The automatic measurement program eliminates the need to develop control programs and cuts development time to zero.

Advantest and SJ Semiconductor Corp. Enter Volume Purchase Agreement for T5830 Memory Testers Leading semiconductor test equipment supplier Advantest Corporation and SJ Semiconductor Corp. (SJSemi), a leading middle-end-of-line (MEOL) semiconductor test-service company based in Jiangyin, China, have signed a volume purchase agreement that calls for the Chinese company to buy numerous T5830 memory testers from Advantest. SJSemi will use the systems in testing service for serial peripheral interface (SPI) NOR flash memory devices, which are in high demand due to booming growth in organic LEDs (OLEDs) and touch display driver ICs (TDDIs). “We are very pleased to enter this strategic agreement with Advantest, and we look forward to continuing the partnership between our companies as we expand our business scope into the growing Memory market and proceed for more complex 3DIC,” said Cui Dong, CEO of SJSemi. SJSemi already has an installed base of Advantest’s V93000 systems for testing high-speed digital and precision analog ICs. The latest order represents the first time that SJSemi has purchased memory testers from Advantest. “China’s growing population base and rising per capita income is driving the growth of the NOR flash memory industry,” said Yoshiaki Yoshida, president and CEO of Advantest. “The development of a sophisticated business infrastructure and the expanding number of key players in this industry, including SJSemi, are contributing to the market’s growth.” Introduced in 2016, the versatile T5830 memory tester is optimized for high-volume, low-cost testing of flash memories widely used in mobile electronics. It can perform wafer sorting and final testing for a broad range of low-pin-count to high-pin-count devices, delivering a substantial return on investment (ROI) and reducing customers’ financial risk. System features include Advantest’s unique Tester-per- Site™ architecture, which enables each site to operate

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