Basic Training 4th Annual ICP Conference

1:4 Laying the Foundation

D. Sample Measurement - (CONT.)

• Overcoming interferences using ICP-OES that include matrix differences between standards and samples; spectral interferences (i.e. - direct spectral overlap, wing overlap, interference with background point); chemical enhancement of atom lines by high matrix element compositions (axial view); and drift due to nebulizer plugging, changes in sample argon, power supply instability, or room temperature changes. • Overcoming interferences using ICP-MS that include matrix differences between standards and samples; mass-discrimination effects; isobaric interferences; detector dead-time; and drift due to nebulizer plugging, changes in sample argon, power supply instability, or room temperature changes.

• Calculating and Reporting the Data - Working with error budgets and calculating the uncertainty is the trickiest part of this stage.

1:5 Laying the Foundation

Training Trace analysis is extremely difficult. All too often, samples submitted as "routine" actually require highly skilled analytical chemists using complex chemical treatments and expensive state-of-the-art equipment. Today, many analysts do not have the proper training, nor do they have access to a more experienced colleague that could offer assistance. The availability of sensitive "push- button" instrumentation is ever increasing. Laboratory supervisors should not assume that an analyst is trained to perform trace analysis if the instrument's instruction manual was the only source of training. Education should be provided for the analyst. Furthermore, job experience and training records should be kept and reviewed on an annual basis.