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IEC 61511:2016 Ed2 in relation to C

PT

CL 11.9.2 d) “

the estimated failure related

to each mode, due to random hardware

failure, which would contribute to a

dangerous failure of the SIS which are

undetected by the diagnostic tests and

undetected by proof test

CL 11.9.5 b) “

evaluate the effect of

possible improvement measures on the

identified devices or parameters (e.g., more

reliable devices, additional defences

against common mode failures, increased

diagnostic or proof test coverage,

increased redundancy, reduced proof test

interval, staggering tests, etc.);