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Source model (same as in AAA)
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Primary source – user-defined circular or elliptical source located at the
target plane which models the bremsstrahlung photons created in the target
that do not interact in the treatment head.
•
Extra focal source – Gaussian plane source located at the bottom of the
flattening filter, which models the photons that result from interactions in
the accelerator head outside the target (primary in the flattening filter,
primary collimators, and secondary jaws).
•
Electron contamination – represents the dose deposited in the build-up
region not accounted for by the primary and extra-focal source components.
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Photons scattered from wedge – represents the scatter from hard wedges,
where present. Implemented with a dual Gaussian model, where the width
of the Gaussian kernel increases with distance from the wedge.
03/01/13