628-629 / 2239
Scanning results in a 5 MV X-ray beam
using p-Si diodes.
Low energy in combination with large beams (here 5 MV and
40x40 cm
2
) displays the largest deviations for Si diodes.
Ion
chamber
=shielded
diode
Unshielde
d diode
Unshielded
diode
Large fraction of
scattered low-energy
photons
Data from Scanditronix
Ion
chamber
Increasing fraction of scattered
low-energy photons