wiredinUSA January2014

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wiredInUSA - January 2014 18
multi-site testing. We plan to move most of our
high-volume production to the V93000 Smart
Scale platform."
The V93000 Smart Scale platformmeets Avago's
requirements for a system that provides a
compact footprint, flexible performance and
advanced features including digital channel
pins for DC testing. The scalable tester is
equipped with an A-class test head, two pin
scale1600digital channel cards andaVI32card,
for a highly parallel, 16-site wafer-sort solution
for the 28nm technology node and beyond.
The system's universal per-pin architecture offers
advanced capabilities for customized solutions.
The semiconductor test equipment supplier Advantest
Corporation has sold a V93000 Smart Scale™ platform
to Avago Technologies' fiber optic products division,
for use in testing optical transceiver devices. This is a
new market sector for Advantest.
"Winning this business shows that Advantest can provide
highly productive and cost-effective test solutions
for applications beyond mainstream semiconductor
production," said Makoto Nakahara, senior vice
president of sales for Advantest Corporation.
"With the V93000 Smart Scale solution, we get all the
features of a fully integrated SoC (system-on-chip) tester
along with scalability at a price that is comparable
with our previous solution," said Faouzi Chaahoub,
senior director of FOPD for Avago. "Additionally, we
have been able to achieve four times the level of
Smart scale
system selection