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new products
three CAN ports including support for the latest CAN FD
high-speed standard, a hardware accelerator for crypto
algorithms including SHA-2, PK and AES, and One-Time-
Programmable (OTP) memory for master-key storage and
tamper prevention. The microcontroller draws very little
current in standby mode, and complements careful power
management throughout the chip to minimize drain on the
vehicle’s electrical supply.
Additional advances include increased thermal dissipation
versus execution performance, which helps simplify
thermal management for optimum reliability, as well as
flexible signal routing that simplifies audio design.
ST supports designers using the new chips with
comprehensive software and middleware IP that
streamlines the design of feature-rich displays and
instruments.
The Accordo 5 family comprising the STA1275, STA1285,
and STA1295 is in sampling phase now. The STA1295
with dual-core Cortex-A7 processor is available in a 19mm
x 19mm x 1.7mm LFBGA529 package. Please contact
your local ST sales office for pricing options and further
information.
NI Demonstrates Autonomous Vehicle
Test Solutions
NI (Nasdaq: NATI), the provider of platform-based
systems that enable engineers and scientists to solve
the world’s greatest engineering challenges, announced
today new technology demonstrations of test solutions
for the rapidly expanding autonomous vehicles market.
These test solutions include all facets of vehicle design,
verification and production, and will be on display at
the Automotive Testing Expo (ATE) USA 2016 in Novi,
Michigan, October 25–27.
Automotive companies today face increased testing
challenges, exacerbated by the emergence of the
connected car and semi- and fully-autonomous vehicles.
Both OEMs and suppliers need flexible test systems
that can quickly adapt to changing technologies and
standards while also delivering a high-level starting point
to speed up system implementation and deployment.
At ATE, NI will showcase theAdvanced Driver Assistance
Systems (ADAS) Radar Test Solution for performing RF
measurements and target simulation for radar sensors;
the HIL Simulator based on the new SLSC open
architecture for switches, loads and signal conditioning;
and the Direct Injector Control Module (DCM) for driving
and controlling any type of injector.
The ADAS Radar Test Solution combines NI’s recently
released PXIe-5840 second-generation vector signal
transceiver (VST) with banded, frequency-specific
upconverters and downconverters designed to test
the 76–81 GHz radar band with 1 GHz of real-time
bandwidth. Engineers can program the VST’s FPGA
with LabVIEW to use the ADAS Test Solution for radar
target emulation, in the range from 1 m to 250 m with a
resolution of 10 cm.
NI’s HIL Simulators are built on open standards like PXI
and SLSC, giving customers complete test coverage by
taking advantage of a massive breadth of native I/O and
signal conditioning that includes cameras and RF for
testing automotive radar.
The DCM is an integrated, turnkey test and measurement
device. Built for injector research, validation and test, it
gives customers the flexibility to control any engine and
drive a large variety of injectors with complex control
solutions and advanced injection profiles.
NI has also extended its platform with an ecosystem
of industry-leading partners in the connected car and
advanced vehicle technology space. Showcased in the
NI booth this year will be Averna for infotainment test,
Bloomy for battery management system test, Danlaw for
V2X communication, IPG for ADAS simulation and test
and Signal.X for in-vehicle noise and vibration analysis.
“From concept to production, NI smarter test solutions
can help customers reduce cost across all stages of
vehicle development and future proof their test systems
against rapidly expanding test requirements,” said
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