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new products
New M4171 System Reduces Cost of
Test and Boosts Productivity While Enabling
Remote Access fromAnywhere in theWorlds
New Rugged, Robust Fiber Optic Repeaters Protect
Leading semiconductor test equipment supplier
Advantest Corporation (TSE: 6857) has developed the
M4171 handler to meet the mobile electronics market’s
needs for cost-efficient thermal control testing of ICs with
high power dissipation during device characterization
and pre-production bring up. This portable, single-site
handler automates device loading and unloading, thermal
conditioning and binning in engineering labs, where
most testing today involves manual device handling. It
also features an active thermal control (ATC) capability
typically available only on larger footprint, more costly
production-volume handlers.
The M4171 can be used to remotely conduct device
handling and thermal control from anywhere around
the world through a network connection. In addition to
requiring fewer operators and lowering labor costs, this
handler maximizes system utilization among working
groups in different locations.
The combination of automated device handling, wide-
temperature ATC capabilities from -45°C to 125°C and
remote operation make the M4171 unique. It can run
multi-mode test processes (Single Insertion Multiple
Temperature), automated testing, automatic ID testing,
output tray re-testing and manual testing, both pre-
defined and user defined.
The Tri Temp Technology on the M4171 enables the
users to operate over a broad range of temperatures
which greatly increases any lab’s efficiency. The system
uses direct device-surface contact, which enables quick
temperature switching for fast ramp up and ramp down
and improves cycle temperature testing by over 40
percent compared to manual thermal-control solutions.
The M4171 handler is compatible with the V93000 and
T2000 platforms as well as other testers. Other features
include a 2D code reader, a device rotator and a high
contact force option. Operation is simple with an intuitive,
easy-to-use GUI that includes pre-defined functions.
“By bringing cost-efficient automated testing into the
lab and enabling our customers to get higher utilization
from their installed base, we are providing substantial
productivity advantages,” said Toshio Goto, executive
officer and manager of the Device Handling business
unit at Advantest. “As our first single-site ATC handler,
the M4171 is opening new market opportunities for
us in device characterization within labs and benchtop
environments.”
Melexis expands temperature sensor
portfolio with innovative miniature FIR
sensor
Melexis announces a new family of miniature far infrared
(FIR) sensors for use in multiple applications where
accurate temperature measurement is required.
The MLX90632 family is based upon Melexis’ established
FIR technology that utilizes the fact that every object emits
heat radiation. The ultra-small integrated thermopile CMOS
IC is a complete solution in a single 3x3x1mm QFN package
including the sensor element, signal processing, digital
interface and optics thereby allowing rapid and simple
integration into a wide variety of modern applications.
The highly accurate device delivers high levels of
thermal stability when experiencing thermal gradients
and rapid temperature changes, thus solving a well-
known weakness of existing infrared sensors. In
addition, it offers a surface mounted (SMD) package
compatible with standard PCB assembly techniques.
The first commercial grade version of the MLX90632
family has been released today. Future versions of the
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