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Layer thickness measurement devices 845

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Wall thickness gauge Echometer basic device

Design: Solid basic device for the measurement of wall thickness and speed of sound with the latest meaduring technology and modern design. The device is suitable both for quick quality inspections in Production as well as for measuring the corroded interiors of tanks or pipelines. The wall thickness measurement range comprises – depending on the test head – 0.5 to 400 mm. During the sound velocity measurement, all sound-conductive materials can be measured with a measurement range of 100 to over 19999 m/s. With large, backlit graphics display in 3 selectable display modes: standard display, differential value and minimum value, limit value monitoring with acoustic and visual control, splashproof housing with impact-absorbing protective rubber frame and support bracket. Automatic probe detection. Supplied with operating instructions, 100 ml coupling means ECHOTRACE and 2 batteries LR44, 1.5 V, in carrying case. Note: Optional measurement value storage and data interface as well as software packages ( "EasyExport" and "iCom" ) available upon request.

IP 54

4935

Dimensions mm

Order No. 0011

131 x 81 x 32

950.00 ◊ (W494)

Design: Supplied with probe DSE 10.4/6PB 4 (1.2 mm to 250 mm), grip sleeve and 10 protection foils. Regular accessory kit for Echometer basic device

4935

Order No. 0013

400.00 ◊ (W494)

Equipment

Measuring

4

Layer thickness gauge Leptoskop ®

Design: Portable layer thickness gauge in pocket-size format, illuminated display with large measurement value display, can also be read overhead. With integrated, spring-loaded probe, calibrated at works, over 10 languages selectable, measurement system can be switched to µm, mm, mils and inches. Device made of black ABS plastic. Dimensions 46 x 95 x 16 mm, weight 70 g. Supplied with micro battery AAA/LR03, 1.5 V, in plastic case. Measurement range:

NFe measurement: 0 to 1200 µm Fe measurement: 0 to 3000 µm Measuring uncertainty (after calibration): • For layers > 100 µm:

1 % ± 1.5 µm 1–3 % ± 1 µm

• For layers • For layers

100–1200 µm: > 1200 µm:

3–5 % ± 1 µm Application: For precise measurement of the layer thickness of paints, lacquers, plastics, rubber, chrome, copper, zinc, anodised layers etc. on metal Note: Replacement battery: (Order No. 9041 0023, Ç 9/12). Optional software packages ("Statistics and data memory", "iCom", "EasyExport") available on request. For the thickness measurement of layers which cannot conduct electricity on non-magnetic, electrically conductive base metals (NFe, e.g. aluminium, copper, brass, bronze, austenite etc.) according to the eddy-current procedure (DIN EN ISO 2360). 0100 For thickness measurements of non-magnetic layers on magnetic base metals (FE, e.g. iron, cast iron, steel, nickel, cobalt etc.) according to the magnetic inductive principle (DIN EN ISO 2178). 0150 4935 4935

4935 0200

Combination probe for NFe and Fe measurements. The type of base metal is automatically detected.

4935

Design

Order No. 0100 0150 0200

NFe

603.00 ◊ 612.00 ◊ 803.00 ◊ (W494)

Fe

Fe/NFe

4/125

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