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Formtracer CS-3200
Series 525 - Surface and Contour Measuring System
Specifications and Styli
Model
CS-3200S4
No.
525-401D
Z2-axis range
[mm]
300
X1-axis range
[mm]
100
ø
1.2
66.5
ø
3
1
59
60
°
ø
4
3.2
10
8
（
6.5
）
12AAD554
Standard stylus
Radius of tip curvature = 2 µm
Tip Material: Diamond
30
°
ø
3
66.5
59
1
3.2
ø
4
8
10
（
6.5
）
12AAD552
Cone stylus
Radius of tip curvature = 25 µm
Tip Material: Sapphire
60
°
0.6
(6.5)
59
3.2
ø
4
9
ø
1.2
10
0.4
66.1
24.8
4
12AAD556
Small hole stylus
Radius of tip curvature = 2 µm
Tip Material: Diamond
60
°
ø
3
ø
1.2
ø
4
67.5
3.2
ø
4
59
(8)
10
18
2
1
(6.5)
12AAD558
Eccentric type stylus
Radius of tip curvature = 2 µm
Tip Material: Diamond
136.5
ø
3
ø
1.2
1
3.2
ø
4
12.5
129
14.5
40
°
(6.5)
12AAD562
2x-long stylus*
1
Radius of tip curvature = 5 µm
Tip Material: Diamond
*
1
: Measuring force is 4mN and the Z1 measuring and resolution is double that of the standard stylus.
60
°
23
3.2
ø
4
21
1
59
66.5
ø
1.2
ø
3
(6.5)
12AAD560
Deep groove stylus
Radius of tip curvature = 2 µm
Tip Material: Diamond
Additional Specifications
Optional
accessories
Other optional and standard
accessories are listed later in different
sections for accessories and styli.
Measuring instrument control
Contour analysis screen
Contour analysis screen
Contour and roughness layout
All products to be sold to commercial customers.
502
All products to be sold to commercial customers. Product illustrations are without obligation. Product descriptions, in particular any and all
technical specifications, are only binding when explicitly agreed upon. For suggested retail prices, please refer to the separate price list.