Table of Contents Table of Contents
Previous Page  131 / 168 Next Page
Information
Show Menu
Previous Page 131 / 168 Next Page
Page Background

Abstracts

P4.32

Magnetic resonance study of high-density atomic hydrogen and

tritium stabilized in solid tritium matrices below 1K

Sheludiakov Sergei(1), Ahokas Janne(1), J¨arvinen Jarno(1), Vainio Otto(1),

Lehtonen Lauri(1), Zvezdov Denis(1,2) Vasiliev Sergey(1), Khmelenko Vladimir

V.(3), Lee David M.(3)

1) University of Turku, Faculty of Mathematics and Natural Science, Department

of Physics and Astronomy, 20014 Turku, Finland

2) Kazan Federal University, Institute of Physics, 18 Kremlyovskaya St., Kazan

42008, Republic of Tatarstan, Russia

3) Texas A&M University, College of Science, Department of Physics and

Astronomy, College Station, TX 77843, USA

We report on a magnetic resonance study of high-density atomic hydrogen

and tritium stabilized in a pure

T

2

and

T

2

:

H

2

matrices below 1K. Average

concentrations of T atoms exceeding 1

.

5

×

10

20

cm

3

were obtained while

storing thin (50-500nm) tritium films at temperature 150mK. The record-high

concentration of H atoms, 9

×

10

19

cm

3

, was reached by storing

T

2

:

H

2

mixtures

where a fraction of T atoms becomes converted into H due to the isotopic exchange

reaction

T

+

H

2

=

TH

+

H

. The maximum concentrations of H and T atoms were

limited by their recombination which occurred in an explosive manner while the

threshold concentrations were found to be dependent both on the film thickness

and storage temperature.

P4.33

Elastic measurements of TLSs in amorphous silicon at mK

temperatures

A. Fefferman

1

, A. Maldonado-Cid

1

, E. Collin

1

, X. Liu

2

, T. Metcalf

2

, G. Jernigan

2

1) Institut N´eel/CNRS and Universit´e Grenoble Alpes, 38042 Grenoble, France

2) US Naval Research Laboratory, SW Washington, DC 20375, USA

The low temperature properties of glass are distinct from those of crystals due

to the presence of poorly understood low-energy excitations. These are usually

thought to be atoms tunneling between nearby equilibria, forming tunneling two

level systems (TLSs). Elastic measurements on amorphous silicon films deposited

with e-beam evaporation suggest that this material contains a variable density of

TLSs that decreases as the growth temperature increases from room temperature

to 400

o

C. We present measurements of the elastic properties of these films down

to 10 mK and an analysis in the framework of the standard tunneling model.

131