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active devices (transistors). APLAC,

the trade name of NI AWR Design

Environment’s

high-frequency

circuit simulation technology, is

seamlessly integrated into both

Microwave Office and Analog Office

circuit design tools. It has been

developed to minimize memory

requirements and simulation run

times while maintaining accuracy

for RF/microwave designs. To

address nonlinear devices for

communication systems, APLAC

now includes a time-variant HB

(circuit envelope) simulator capable

of addressing circuits excited by

non-periodic signal sources such

as modulated RF signals. The

associated measurements provide

the time-varying voltage or current

of a particular carrier and the

associated spectrum surrounding

Figure 3. Mesh of 3D planar 3 x 3 patch antenna array and radiation patterns in AXIEM.

surface roughness impacts electrical

behavior, such as insertion loss.

In addition, Analyst V13 also

introduces new 3D editor

functionality and improvements

targeting drawing (sketcher)

functions and solid object

controls, materials and attributes

organization in the browser tree,

auto-complete for parameter and

variable expression, and variable

grouping and sorting, to highlight a

select few.

Third-Party EM

Technologies

The AWR Connected™ family of

solutions that link NI AWR software

to third-party solutions is now

enhanced to further automate the

flow of layout data from NI AWR

Design Environment into partner EM

products. In V13, AWR Connected

for EM simulators, which includes

ANSYS HFSS, CST, and Sonnet, is

more robust and fully bi-directional.

After the layout is created in the

Microwave Office layout editor,

third-party EM tools can readily

be selected as the EM simulator of

choice (Figure 4) and the resulting

dataset is automatically imported

back into Microwave Office to tune,

optimize, perform yield analysis,

and verify results.

Circuit/System

Simulation and Models/

Libraries

Harmonic Balance

Technology

Harmonic balance simulation is an

essential technology in analyzing RF/

microwave nonlinear circuits with

New-Tech Magazine Europe l 33