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Chemical Technology • September 2015

26

FOCUS ON CONTROL

& INSTRUMENTATION

At-Line analysis of sulphur in fuels using ED-XRF spectroscopy

A new application brief explaining how

the use of ED-XRF spectroscopy for at-

line analysis of sulphur in fuels can cut

production delays from days to minutes

is now available to download from http://

xrf.spectro.com/spectroscout/at-line/

analysis-of-sulphur-in-fuels.

Sulphur content is a key quality deter-

minant for many petroleum products and

the knowledge of the content of sulphur

in fuels impacts processing and assists

compliance with government regulations.

Traditionally, the analysis of sulphur in fuels

has been performed in the laboratory using

XRF spectroscopy. However, the practice

often results in production delays due to

the time required to transport samples from

the line to the laboratory as well as the time

samples spend waiting in queue in the lab

to be processed.

Now, a new generation of portable

ED-XRF spectrometers is enabling rapid

and accurate at-line analysis — right at

the production line — for many applica-

tions requiring the detection of sulphur

in fuels. According to the new application

brief, "At-Line Analysis of Sulphur in Fuels

According to ASTM D4294 Using ED-XRF

Spectrocopy," with a por-

table ED-XRF spectrometer,

at-line analysis can be per-

formed once the sample is

collected from any process

point — and it fully conforms

to the ASTMD4294 require-

ment for analysis time of 1

to 5 min per sample."

In addition to an intro-

duction and discussion of

the need for at-line QC, the

new brief discusses the

advances and advantages

of portable ED-XRF technol-

ogy for at-line analysis of

sulphur in fuels. The brief

also documents, in detail,

the at-line analysis of a

series of samples using a SPECTROSCOUT

portable spectrometer equipped with a

transmission target X-ray tube (Rh target),

a filter changer, a helium purge system

and a high resolution large area SDD. The

resolution of the SDD used amounted to

<155 eV (Mn Kα) at an input count rate of

up to 200,000 cps. The results from the

tests showed compliance with criteria set

out in ASTM D4294.

The brief concludes with helpful guid-

ance for the specification and selection of

an at-line ED-XRF system.

For more information

contact Tom Milner,

in Germany, on tel: +49 2821 8920 or

Don Goncalves, in the USA on tel: +1-781-

793-9380 or

dgoncalves@tizinc.com

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