Previous Page  21 / 84 Next Page
Information
Show Menu
Previous Page 21 / 84 Next Page
Page Background

will introduce a massive amount

of documentation changes (not to

mention any possible signal integrity

issues with changing cable lengths

to the mass interconnect). This

form-factor challenge is one of the

many reasons that modular platforms

like PXI (and formerly VXI) have

dominated the Aerospace/Defense

ATE market for the last 30 years. By

following the strict guidelines of the

PXI specification, a scope from vendor

A will be the same size and utilize

the same backplane power as vendor

B, giving test engineers an easier

upgrade path for their systems.

The second hurdle in the road is

hardware abstraction layer (HAL)

integration. Any test system that is

expected to last for five to 10+years will

inevitably have planned maintenance

and operational costs. These are

significantly reduced by abstracting

vendor-specific hardware and drivers

into a HAL or measurement abstraction

layer (MAL). The test engineer is also

tasked with evaluating the driver stack

of the new instruments to ensure

they plug into the HAL to mitigate the

risk when migrating the thousands of

TPSs still to come. Many HALs utilize

the IVI driver class where possible

and supplement with Plug-and-Play

drivers. Since this example is an

oscilloscope, we’ll make a blanket

claim that the test engineer has it

“easy” and gets a pass on software

because there is an existing IVI class

specified for oscilloscopes.

Hardware Abstraction Layers (HALs)

significantly mitigate the impact of

hardware obsolescence, but are

difficult to justify in the absence of a

long-term support strategy.

Hardware Abstraction Layers (HALs) significantly mitigate the impact of hardware obsolescence, but are

difficult to justify in the absence of a long-term support strategy.

While difficult

to accomplish,

emulating legacy

instrument

capabilities

greatly reduces

the risk of TPS

migration issues.

Software-

Designed,

or Synthetic

Instruments,

offer a unique

approach to

test equipment

emulation

A third and often hidden hurdle is the

answer to the question: is better really

better?The specifications of this new

oscilloscope are multiple generations

of technology ahead of the obsolete

equipment, so where’s the issue?

The issue comes when, for example,

you insert this new oscilloscope

into the system and the rise time or

settling time measurements change

significantly because you’re sampling

at three, five, or 10times the rate of

the previous instrument, which results

in dozens of incompatible TPSs that

previously provided great system

utilization. Another issue arises

when legacy TPSs require trigger

functionality that instrument vendors

made obsolete years or decades prior.

In this situation, the test engineer is

challenged with looking across the

entire database to identify which

TPSs will be broken by inserting a

new instrument that does not support

the legacy trigger functionality - a

database which often doesn’t exist

and requires weeks or months of

manual effort to identify.

In order to minimize the unknown

risks of TPS rehosting, many test

engineers are taking advantage of

software-designed instruments (SDIs)

to give more flexibility in the rehosting

process. Software-designed (also

known as synthetic) instruments

combine core analog and digital

front-end technology with powerful,

user-programmable FGPAs to provide

the most flexible instruments on the

New-Tech Magazine Europe l 21