Previous Page  73 / 84 Next Page
Information
Show Menu
Previous Page 73 / 84 Next Page
Page Background

new products

New-Tech Magazine l 73

Gallery. The first beta version of the

integrated tools was launched in

June 2015 and has been tested by

Renesas’ customers since October

2015. The full release of EWARM-

RS is planned for June 2016.

Find more information and try the

Renesas Synergy Platform at www.

renesassynergy.com

.

Mentor Graphics

Optimizes Tools and Flows to

Help Designers Succeed With

Samsung Foundry’s 10nm

FinFET Process

Mentor

Graphics

Corporation

(NASDAQ: MENT) announced

that, in collaboration with Samsung

Electronics, it is delivering a wide

range of design, verification and

test tools and flows optimized for

Samsung Foundry’s 10nm FinFET

process.

The

announcement

includes the Calibre® physical

verification suite, Mentor® Analog

FastSPICE™ (AFS™) platform,

Olympus-SoC™ digital design

platform and Tessent® test product

suite. These tools have been

optimized and certified so that

system-on-chip (SoC) designers

can quickly adopt Samsung

Foundry’s advanced 10nm process

with greater confidence in first-pass

success.

The interplay between design

styles

and

manufacturing

processes becomes even more

critical at 10nm, so Design for

Manufacturability (DFM) tools play

a critical role in the verification flow.

Samsung Foundry has certified

the Calibre YieldEnhancer product

—and specifically its SmartFill

and

ECO/Timing-Aware

Fill

capabilities — to help designers

make multiple design changes and

still comply with manufacturing

planarity requirements and tape-out

schedules. To help designers identify

and fix potential lithography-related

issues, Samsung supports the use

of the Calibre LFD™ tool, which

is based on Mentor’s production-

deployed solutions for process-

window modeling, mask synthesis,

optical proximity correction (OPC)

and resolution enhancement (RET).

As design teams address multiple

DFM elements simultaneously,

they can use the Samsung DFM

scoring and analysis solution built

on the Calibre YieldAnalyzer tool to

streamline the process of making

tradeoff decisions. Finally, for fast

feedback

from

manufacturing

results to customer design

processes, Samsung supports yield

detractor pattern identification and

repair using the Calibre Pattern

Matching solution.

For physical verification, the

Calibre nmDRC™ platform is now

certified for 10nm, and remains

the ecosystem’s touchstone sign-

off solution for Samsung R&D, IP

validation, and fabless customer

design tape-outs. This release

marks the culmination of years

of collaboration in manufacturing

process development for triple

patterning and quadruple patterning

with

Calibre

Multi-Patterning

technology.

Samsung Foundry has also certified

the Calibre xACT™ product to

deliver detailed accuracy and high

throughput for parasitic extraction

at 10nm. The Calibre xACT tool

uses an integrated field solver to

calculate parasitics around the

complex, three-dimensional FinFET

structures. It optimizes performance

through a highly scalable parallel

processing approach.

Other certifications help SoC

designers

complete

circuit

verification, physical implementation

and IC test. For example, the AFS

platform is certified in Samsung’s

10nm process device models and

design kits. Mutual customers rely

on AFS to deliver nanometer SPICE

accuracy faster than traditional

SPICE simulators for verifying

analog, RF, mixed-signal, memory,

and custom digital circuits.

The Olympus-SoC place and route

platform is also certified for use

at 10nm, with a comprehensive

colored

design

methodology

covering floorplanning, placement,

extraction, routing and chip finishing

requirements. To address the

particular challenges of FinFET

manufacturing,

the

platform

supports M1 triple patterning, color

shifting, non-uniform tracks, mask-

and width-dependent spacing rules,

and other new capabilities. Active

deployment is underway at multiple

mutual customers.

For test, Mentor and Samsung

have collaborated to make the

Tessent test product suite deliver

higher test quality for new cell-

internal structures at 10nm, as well

as higher test pattern compression

to control the cost of testing larger

10nm designs. The companies

are also leveraging production test

diagnosis to quickly identify and

eliminate design-specific and cell-

internal yield limiting features during

design ramp-up.

“Our collaboration with Samsung

Foundry goes beyond helping

bring this advanced process to joint

customers,” stated Joe Sawicki, Vice

President and General Manager of

Mentor Graphics Design-to-Silicon

Division. “The joint solution spans

design verification, manufacturing,