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46

Tube Products International July 2015

www.read-tpi.com

products & developments

Pushing the limits of EDM inspection

Scan Systems, a USA-based company

in the OCTG industry, offers “out-of-

the-box” on-location custom flaws

and artificial reference indicators to

create test standards for calibration.

The company has developed innovative

detection technology over the years that

has helped to overcome a number of

challenging industry obstacles.

EMI inspection machines have

traditionally relied upon slip rings to

transmit data from the longitudinal

rotating assembly back to the computer

for processing and interpretation. Worn

out or dirty slip rings can cause signal

loss, leading to less reliable data and

unseen indication of potential flaws.

Scan Systems applied some Silicon

Valley-style technology to the EMI

process and has incorporated wireless

capabilities into its M-Series EMI

inspection equipment, and removed

slip rings from data transmission. This

development utilises a Wi-Fi radio inside

a rotating head spinning up to 250rpm,

and overcomes the large amount of

magnetic flux created by the surrounding

large electromagnets. This benchmark

in the industry allows for improved data

accuracy and elimination of significant

data errors, and because the data is

digitised immediately at the sensor, any

signal noise from outside interference

is non-existent. “Your Internet went

wireless years ago. It’s about time that

EMI inspection equipment followed

suit,” said Matt Rutledge, general

manager/VP of Scan Systems.

Scan Systems’ ESP upgrade to its

M-Series line is the first EMI inspection

technology to use hall elements in the

longitudinal sensors, which enable

detection and repeatability on flaws up

to 30° off the axis on the OD surface

and 20° off axis ID surface (industry

standard is 7° to 10° off axis).

Additionally, by utilising hall elements,

the number of sensors can increase

from 16 to 64 channels of data for

better resolution and ability to detect

much smaller flaws than the limitations

of traditional PC coils. Scan Systems

claims to be the first in the world to

bring the ability to detect oblique flaws

to EMI inspection. Also, because of the

use of hall elements and the proprietary

Digi-Pro

®

processing software, if the

operator is set to detect at 30°, he

will pick up flaws between 0° and 30°,

making for a more accurate and precise

pass.

Scan Systems has developed an

EMI system that can report the linear

location of a longitudinal flaw, the

circumferential location, and whether it

is on the ID or OD surface of the pipe.

Historically, EMI inspection equipment

was limited to reporting the linear

location of a potential flaw. Though a

few manufacturers would discriminate

between ID and OD indications, the

reliability of the methods utilised made

the reporting less than accurate. Through

significant innovations made in sensor

technology, data collection methods

and sophisticated software algorithms,

Scan Systems’ latest ESP upgrade to

the Pitco™ M-Series EMI inspection

now provides the inspector with a level

of accuracy unseen in EMI inspection

of OCTG material. This advancement

provides the circumferential location

and can report on multiple flaws on

the same plane and ID/OD location in

degrees of probability, saving valuable

time during the prove-up process.

One of the toughest tasks for an EMI

unit operator can be interpreting and

locating the signal from a pipe flaw.

Having an alternative view of the data

can be beneficial in determining a pipe’s

condition. Scan Systems developed a

display that not only makes it easy to

illustrate where pipe flaws are located

but also provides additional information

on the characteristics of the flaw.

Many OCTG MFL equipment manu-

facturers claim their machines detect

flaws on 0.545" (13.84mm) walls and

greater during the inspection process,

but often these claims ignore a key

component of a quality inspection –

repeatability.

This refers to equipment’s hardware and

software capabilities to identify the signal

given by an imperfection or artificial

reference indicator and report those

imperfections at a similar amplitude

consistently and repeatedly.

API 5CT specifications require a

minimum of 20 per cent repeatability

on all inspection runs. Using advanced

signal processing algorithms combined

with proprietary sensors and cutting-

edge signal detection hardware, Scan

Systems’ Pitco M-Series with ESP

upgrade has dramatically improved the

ability to separate a flaw’s signal from the

background noise offering the best S:N

ratio on any given pipe. Scan Systems’

Pitco M-Series with ESP upgrade can

reliably detect and repeat on N5 ID

notches up to 0.545" (13.84mm) wall

thickness and N10 ID notches up to

0.625" (15.875mm) walls.

Scan Systems Corp

– USA

mattr@scansystems.com www.scansystems.com

The Pitco M-Series from Scan Systems