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SRM 1974c

Page 4 of 9

Table 1. Certified Mass Fraction Values for Selected PAHs in SRM 1974c

Mass Fraction

(a,b,c)

(μg/kg)

k

Wet-Mass Basis

Dry-Mass Basis

Fluorene

2.31

r

0.04

22.6

r

0.4

1.97

Dibenzothiophene

1.53

r

0.02

15.0

r

0.2

1.99

Phenanthrene

19.6

r

0.4

191

r

4

1.96

Anthracene

1.17

r

0.08

11.4

r

0.8

1.97

1-Methylphenanthrene

3.07

r

0.11

30.0

r

1.1

1.97

2-Methylphenanthrene

4.56

r

0.04

44.5

r

0.5

1.97

3-Methylphenanthrene

4.09

r

0.03

39.9

r

0.4

1.97

9-Methylphenanthrene

2.46

r

0.02

24.0

r

0.3

1.97

2-Methylanthracene

0.951

r

0.007

9.3

r

0.1

1.97

Fluoranthene

45.3

r

0.8

442

r

9

1.97

Pyrene

23.9

r

1.6

233

r

15

1.97

Benzo[

ghi

]fluoranthene

3.03

r

0.09

29.5

r

0.9

1.96

Benzo[c]phenanthrene

1.99

r

0.04

19.4

r

0.4

1.97

Benz[

a

]anthracene

5.69

r

0.11

55.5

r

1.1

1.96

Benzo[

k

]fluoranthene

2.75

r

0.02

26.8

r

0.3

2.04

Benzo[

a

]fluoranthene

0.543

r

0.006

5.30

r

0.07

1.97

Benzo[

e

]pyrene

7.33

r

0.05

71.6

r

0.7

1.98

Benzo[

a

]pyrene

2.32

r

0.03

22.6

r

0.3

1.96

Perylene

0.560

r

0.022

5.46

r

0.22

1.97

Benzo[

ghi

]perylene

2.82

r

0.05

27.6

r

0.5

1.97

Benzo[

b

]chrysene

0.694

r

0.013

6.77

r

0.13

1.97

Picene

1.36

r

0.08

13.2

r

0.8

1.97

(a)

Mass fractions are reported on both wet- and dry-mass basis; material as received contains 89.75 %

r

0.08 % (95 % confidence

level) water.

(b)

The certified value reported on a wet-mass basis is a weighted mean of average mass fractions, with one average each from two

analytical methods [3,4]. The expanded uncertainty is the half width of a symmetric 95 % parametric bootstrap confidence

interval [5], which is consistent with the ISO Guide [6,7]. The effective coverage factor

k

is included in the table for each PAH.

(c)

GC/MS (Ia) using SPE clean-up followed by analysis on a DB-17MS column using EI-MS and GC/MS (IIa) using SPE and SEC

clean-up followed by analysis on a DB-XLB column using EI-MS.