WiredInUSA March 2016

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wiredInUSA - March 2016 65
new-generation compacting and drawing
dies.
Led by Christopher Thornton, the company
will continue on its mission, bringing the
benefit of this technology to wire and
cable markets worldwide. The Nano team
took part in wire South America in Brazil last
year and will be at wire 2016 in April. The
company is currently recruiting new team
members to take the business to a new
level in the coming years.
Nano-Diamond America is planning to
expand its shaped die capacity from simple
shapes to more sophisticated shapes.
This will enable shaped wire manufacturers
to obtain better control of the shape and
better finish on the wire, as well as longer
die life compared to the TC dies that are
commonly used.
Nano-Diamond America Inc – USA
Website:
NDC Technologies
Booth: 11D68
NDC Technologies will exhibit the latest
Beta LaserMike products for in-process
dimensional monitoring and automated
quality cable testing. The new line-up
delivers higher accuracies, production
efficiencies and savings for profit-minded
wire and cable manufacturers.
NDC will be introducing the latest addition
to the AccuScan 6000 Series 4-axis diameter
gauge family: the new AccuScan 6050.
Like the AccuScan 6012 gauge which was
released last year, the AccuScan 6050
provides a comprehensive measurement
coverage around the product’s
circumference to instantly detect changes
in product diameter.
The AccuScan 6050 measures products
up to 50mm, while the AccuScan 6012
measures products up to 12mm.
Both gauges perform ultra-fast diameter
and ovality measurements at 9,600 scans
per second and are claimed to offer the
highest single-scanaccuracy in the industry,
with single-scan repeatability down to 2
micron with the AccuScan 6050 and down
to 1 micron with the AccuScan 6012.
In addition, both gauges improve ovality
accuracy up to 100 per cent and provide
the highest flaw detection accuracy with
25 percent improvement over three-axis
measurement methods.
The new DCM SCS-700 efficiently tests
Cat 5e/6/6a cables to 700MHz and offers
a low-frequency option to test cables
down to 100Hz. Dual-frequency testing
is performed with a single connection to
significantly reduce set-up and testing time.
Automated four-pair switching platform
enables operators to perform cable testing
in less than three minutes. Easy-to-use
S S Nano-Dies from Nano-Diamond America