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Figure 10. Load-pull (left) and power swept nonlinear data (right) for RF5110G amplifier
device information and allows the
amplifier to be treated as a black box.
When extracted properly, the result is
a model that can be used for multi-
stage nonlinear analyses and design
optimizations of individual amplifier
output or inter-stage matching circuits.
Information and simulations from
example models were used to illustrate
the type of documentation provided
for each model along with a range
of measurement validations showing
excellent correlations are possible with
nonlinear test data, even if derived
from completely independent test
benches and verifying test data not
used as part of the model development
data set.
Acknowledgements and
Additional Information
The authors would like to
thank Keysight Technologies for
collaboration related to this work
as part of the Keysight Solution
Partnership program. In particular,
we would like to thank Chad Gillease
for his great technical support and
Jose Civello of Keysight for his helpful
editing comments.
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