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for random hardware failures of ≤10-8

per hour.

These metrics are often seen as a

normative requirement, although

in practice they are a proposal, and

developers can justify their own target

metrics because the objective is to

enable safe products, not add bullet

points to a product datasheet.

A question I often ask myself in

respect of semi-autonomous driving

is whether it’s safer to meet the

standard’s proposed metrics for ASIL

D with 10,000 DMIPS of processing

or have 100,000 DMIPS with reduced

diagnostic coverage and enable

Get it delivered

When developing for functional safety,

an essential part of the product is

the supporting documentation which

needs to include a safety manual

to outline the product’s safety

case, covering aspects such as the

assumptions of use, explanation of its

fault detection and control capabilities

and the development process followed.

Safety cases are hierarchical in use,

the case for an IP is needed by chip

developers to form part of their safety

case which then enables their customer

and so forth. Most licensable silicon IP

will be developed as a Safety Element

out of Context (SEooC), where its

designers will have little no idea how

it will subsequently be utilised. Hence

the safety manual must also capture

insight from the IP developers about

their expectations in order to avoid

inappropriate use.

At ARM we support users of targeted

IP with safety documentation

packages, which always includes a

safety manual.

So in summary when planning for

functional safety think PDS:

Process

Development

Safety documentation package

‘smarter’ algorithms with better

judgement? The answer is application

specific, although in many cases a

more capable performant system could

save more lives than a more resilient

system with basic functionality, so

long as its failure modes are not wildly

non-deterministic.

Irrespective of the diagnostic coverage

achieved, it’s essential to follow

suitable processes when targeting

functionally safe applications – and

this is where the standards really help.

Even if you’re not targeting safety,

more rigorous processes can improve

overall quality.

Figure 2. Classes of fault

Table 1. ISO 26262 proposed metrics

New-Tech Magazine Europe l 55